A study on the quantitative relationship between the gray value of active terahertz images and transmission thickness

Fengxia Zhu; Hongfei Zhang; Zhilong Li; Moxuan Yang; Yuanmeng Zhao; Cunlin Zhang

doi:10.1117/12.2616565

8 July 2022 A study on the quantitative relationship between the gray value of active terahertz images and transmission thickness

Fengxia Zhu, Hongfei Zhang, Zhilong Li, Moxuan Yang, Yuanmeng Zhao, Cunlin Zhang

Author Affiliations +

Proceedings Volume 12284, 2021 International Conference on Optical Instruments and Technology: IRMMW-THz Technologies and Applications; 122840B (2022) https://doi.org/10.1117/12.2616565
Event: 2021 International Conference on Optical Instruments and Technology, 2022, Online Only

Abstract

Terahertz imaging has a wide range of applications in the field of nondestructive testing. In this paper, a novel thickness-testing method based on active terahertz imaging with a non-cooled focal plane array terahertz camera is proposed, which uses the poly tetra fluoroethylene (PTFE) as the object to study. Firstly, we capture the active terahertz images of PTFE wafers of different thickness using IRXCAM-THz-384 camera. Second, by using the curve fitting method, interpolation method, grey theory model, neural network and support vector machine, the relationship between the thickness of PTFE wafers and grayscale is predicted. Then the accuracy of different methods is compared. Finally, we establish the thickness-grayscale relationship model. The experimental results show that the predicted greyscale data is close to the actual data, and the error range can be controlled within 1%, which verifies the accuracy of the model and meets practical engineering application standards.

Citation Download Citation

Fengxia Zhu, Hongfei Zhang, Zhilong Li, Moxuan Yang, Yuanmeng Zhao, and Cunlin Zhang "A study on the quantitative relationship between the gray value of active terahertz images and transmission thickness", Proc. SPIE 12284, 2021 International Conference on Optical Instruments and Technology: IRMMW-THz Technologies and Applications, 122840B (8 July 2022); https://doi.org/10.1117/12.2616565

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KEYWORDS

Data modeling

Terahertz radiation

Cameras

Error analysis

Millimeter wave imaging

Statistical modeling

Image processing

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