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We propose a new single pixel microscope with optical sectioning properties by using structured illumination techniques. The method uses single-pixel imaging (SPI) techniques by interrogating the sample with a series of spatially resolved patterns and measuring the output intensities with a non-spatial resolution detector. Moreover, optical sectioning is obtained by adding a grating to the system and employing Structured Illumination Microscopy (SIM). The system allows us to perform 3D bright-field and fluorescence microscopy. We apply compressive sensing techniques to decrease the acquisition time.
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Luis Ordóñez, Erick Ipus, Armin J. M. Lenz, Jesús Lancis, Enrique Tajahuerce, "Optical sectioning microscopy with structured illumination and single-pixel detection," Proc. SPIE 12385, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXX, 1238503 (16 May 2023); https://doi.org/10.1117/12.2650306