Presentation + Paper
16 May 2023 Optical sectioning microscopy with structured illumination and single-pixel detection
Author Affiliations +
Abstract
We propose a new single pixel microscope with optical sectioning properties by using structured illumination techniques. The method uses single-pixel imaging (SPI) techniques by interrogating the sample with a series of spatially resolved patterns and measuring the output intensities with a non-spatial resolution detector. Moreover, optical sectioning is obtained by adding a grating to the system and employing Structured Illumination Microscopy (SIM). The system allows us to perform 3D bright-field and fluorescence microscopy. We apply compressive sensing techniques to decrease the acquisition time.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Luis Ordóñez, Erick Ipus, Armin J. M. Lenz, Jesús Lancis, and Enrique Tajahuerce "Optical sectioning microscopy with structured illumination and single-pixel detection", Proc. SPIE 12385, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXX, 1238503 (16 May 2023); https://doi.org/10.1117/12.2650306
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KEYWORDS
Light sources and illumination

Microscopes

Optical gratings

Optical microscopy

Digital micromirror devices

Fluorescence

Photodetectors

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