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17 March 2023 Time-resolved measurement of stress wave profile during femtosecond laser processing of synthetic silica glass
Junya Hattori, Yusuke Ito, David Veysset, Keiichi Nakagawa, Keith Nelson, Naohiko Sugita
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Proceedings Volume 12411, Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XXIII; 124110A (2023) https://doi.org/10.1117/12.2647922
Event: SPIE LASE, 2023, San Francisco, California, United States
Abstract
Stress waves propagating inside materials play a significant role in femtosecond laser processing. In this study, we measured femtosecond-laser-induced stress waves inside synthetic silica glass using a time-resolved Mach–Zehnder interferometer. A laser pulse with a wavelength of 1030 nm, pulse width of 180 fs, and pulse energy of 100 μJ was used to induce stress waves. The three-dimensional distribution of the refractive-index change of the stress wave was obtained via reconstruction using the inverse Abele transform. This result contributes to the further development of femtosecond laser processing.
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Junya Hattori, Yusuke Ito, David Veysset, Keiichi Nakagawa, Keith Nelson, and Naohiko Sugita "Time-resolved measurement of stress wave profile during femtosecond laser processing of synthetic silica glass", Proc. SPIE 12411, Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XXIII, 124110A (17 March 2023); https://doi.org/10.1117/12.2647922
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KEYWORDS
Femtosecond phenomena
Glasses
Laser processing
Acoustic waves
Laser interferometry
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