Spectrally responsive edge illumination x-ray phase contrast imaging (XPCI)

Ava X. Hurlock; Timothy Koh; Mauricio Martinez; Michael E. Gehm

doi:10.1117/12.2663798

14 June 2023 Spectrally responsive edge illumination x-ray phase contrast imaging (XPCI)

Ava X. Hurlock, Timothy Koh, Mauricio Martinez, Michael E. Gehm

Proceedings Volume 12531, Anomaly Detection and Imaging with X-Rays (ADIX) VIII; 125310F (2023) https://doi.org/10.1117/12.2663798
Event: SPIE Defense + Commercial Sensing, 2023, Orlando, Florida, United States

Abstract

X-ray Phase Contrast Imaging (XPCI) is an imaging method used to retrieve phase information from an object, thereby revealing more object characteristics, such as refractive index and thickness. Edge Illumination (EI) is a non-interferometric type of XPCI that is spatially dependent. We developed and simulated an alternative type of EI known as Spectrally Responsive Edge Illumination (SREI), which is energy dependent and utilizes an energy-resolving detector. SREI is intended to be more easily implementable than EI due to fewer precision limitations. We will detail results of our SREI experimental investigation and our plan going forward.

Conference Presentation

Citation Download Citation

Ava X. Hurlock, Timothy Koh, Mauricio Martinez, and Michael E. Gehm "Spectrally responsive edge illumination x-ray phase contrast imaging (XPCI)", Proc. SPIE 12531, Anomaly Detection and Imaging with X-Rays (ADIX) VIII, 125310F (14 June 2023); https://doi.org/10.1117/12.2663798

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