Micro resistance measurement system based on single chip microcomputer

Yipeng Zhang; Shuangjie Liu

doi:10.1117/12.2675179

25 May 2023 Micro resistance measurement system based on single chip microcomputer

Yipeng Zhang, Shuangjie Liu

Proceedings Volume 12636, Third International Conference on Machine Learning and Computer Application (ICMLCA 2022); 126363E (2023) https://doi.org/10.1117/12.2675179
Event: Third International Conference on Machine Learning and Computer Application (ICMLCA 2022), 2022, Shenyang, China

Abstract

In the environment of rapid development of technology, scientific research, processing, manufacturing and other fields are also developing in the direction of richer functions and more sophisticated design, and the requirements for the properties of various parts are becoming increasingly strict. In the field of electronic information, the small resistance of a part also deeply affects the quality of the product. In this paper, a set of micro resistance measurement system based on MCU is completed by combining the relevant knowledge of MCU with resistance measurement technology. The micro resistance measurement system based on STC89C52 single chip microcomputer is designed to provide better experience for users, and intelligent products are designed around customer needs. A micro resistance measurement system including LCD module and resistance measurement module is designed. The micro resistance measurement system based on SCM designed in this paper effectively reduces the system volume, improves the portability of the system, effectively reduces the production cost, has high measurement accuracy, and makes the system easy to use. It is a convenient and fast integrated design of SCM system that can adapt to various workplaces.

Citation Download Citation

Yipeng Zhang and Shuangjie Liu "Micro resistance measurement system based on single chip microcomputer", Proc. SPIE 12636, Third International Conference on Machine Learning and Computer Application (ICMLCA 2022), 126363E (25 May 2023); https://doi.org/10.1117/12.2675179

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