Multiresolution image processing for rough defect classification

Johannes Giet; Bernd Kleinemeier

doi:10.1117/12.20250

1 August 1990 Multiresolution image processing for rough defect classification

Johannes Giet, Bernd Kleinemeier

Proceedings Volume 1265, Industrial Inspection II; (1990) https://doi.org/10.1117/12.20250
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands

Abstract

A special application case of multiresolutlon image processing is pointed out. From the imager's original picture. a set of image copies is derived. Each of these copies is generated with different demagnification factors along both image coordi- nates. Simple compact object structures are demagnifled from picture to picture and appear in a specific reduced image as single pixels. For a real-time application, a tailored hardware solution was constructed, which involves a special filter design to minimize accumulation of anti-allasing errors. The application for rough defect classification during strip material fabrication is discussed. In this case, flaws of a given length/width ratio can easily be detected by simple, minimum templates.

Citation Download Citation

Johannes Giet and Bernd Kleinemeier "Multiresolution image processing for rough defect classification", Proc. SPIE 1265, Industrial Inspection II, (1 August 1990); https://doi.org/10.1117/12.20250

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