Method of DC side short circuit fault location in metro power supply system based on improved genetic algorithm

Dangchao Ge; Rui Shi

doi:10.1117/12.2679676

18 July 2023 Method of DC side short circuit fault location in metro power supply system based on improved genetic algorithm

Dangchao Ge, Rui Shi

Author Affiliations +

Proceedings Volume 12722, Third International Conference on Mechanical, Electronics, and Electrical and Automation Control (METMS 2023); 127220N (2023) https://doi.org/10.1117/12.2679676
Event: International Conference on Mechanical, Electronics, and Electrical and Automation Control (METMS 2023), 2023, Hangzhou, China

Abstract

After the short-circuit fault occurs in the subway DC power supply system, the traditional manual line patrol troubleshooting method not only takes a lot of time and effort, but also increases the workload in today's subway system with the increase of lines. The system becomes more complex, resulting in longer power outage time and unnecessary economic losses. In this paper, the improved genetic algorithm is adopted to solve the metro fault location. The optimal solution of the short circuit fault calculated by the single-ended genetic algorithm is solved by the genetic algorithm every time. Although the solution converges to a certain value, the value is not the same every time, it fluctuates back and forth in a certain range. By setting a reasonable threshold, the fault can be identified quickly and accurately. The reactance voltage drop of the fault pole is significantly greater than that of the non-fault pole. The obtained optimal solution of the short-circuit fault position can quickly and accurately determine the fault position, so that the fault recovery time can be shortened. The operation efficiency can be improved, which is of great significance for ensuring the safe operation of a power supply system.

Citation Download Citation

Dangchao Ge and Rui Shi "Method of DC side short circuit fault location in metro power supply system based on improved genetic algorithm", Proc. SPIE 12722, Third International Conference on Mechanical, Electronics, and Electrical and Automation Control (METMS 2023), 127220N (18 July 2023); https://doi.org/10.1117/12.2679676

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