Research on leading scan technology and its application in NDT of nuclear power

Haimin Su; Linhui Sun; Shaoming Wei; Dawei Xu

doi:10.1117/12.2684347

1 August 2023 Research on leading scan technology and its application in NDT of nuclear power

Haimin Su, Linhui Sun, Shaoming Wei, Dawei Xu

Proceedings Volume 12754, Third International Conference on Computer Vision and Pattern Analysis (ICCPA 2023); 127542E (2023) https://doi.org/10.1117/12.2684347
Event: 2023 3rd International Conference on Computer Vision and Pattern Analysis (ICCPA 2023), 2023, Hangzhou, China

Abstract

This paper introduces the principle and structure of the film digitizing system,and through the scanning and analysis of nuclear film, it proves that after the traditional film A/D signal conversion,the digital film meets the DS level of ISO14096 in terms of the sensitivity of the image quality meter,defects and detail display.In addition,the digital technology of film is studied from three aspects: negative signal transformation mode,superposition and splicing processing function and defect evaluation. Firstly,the digital software is used to superposition and splice the original signal of the film to evaluate the double film, so as to reduce the defect detection rate of the overlapped part. AI intelligent system can helpautomatically identify defects, reduce the risk that the detection results are easily affected by human factors, and is better than traditional ray defect detection which mainly relies on manual evaluation. In particular, the 3D modeling module can extract and analyze the negative data signals to complete the assessment of the negative quality, which has its unique advantages and great significance for the optimization of welding and manufacturing processes.

Citation Download Citation

Haimin Su, Linhui Sun, Shaoming Wei, and Dawei Xu "Research on leading scan technology and its application in NDT of nuclear power", Proc. SPIE 12754, Third International Conference on Computer Vision and Pattern Analysis (ICCPA 2023), 127542E (1 August 2023); https://doi.org/10.1117/12.2684347

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