Fast calibration based photometric stereo for multiscale metallic surface measurement

Long Ma; Xu Liu; Yuzhe Liu; Shengwei Guo; Wenjie Li

doi:10.1117/12.2687610

27 November 2023 Fast calibration based photometric stereo for multiscale metallic surface measurement

Long Ma, Xu Liu, Yuzhe Liu, Shengwei Guo, Wenjie Li

Proceedings Volume 12769, Optical Metrology and Inspection for Industrial Applications X; 127690D (2023) https://doi.org/10.1117/12.2687610
Event: SPIE/COS Photonics Asia, 2023, Beijing, China

Abstract

Multiscale analysis and characterizations of metallic surface topographies is a crucial task in advanced manufacturing and precision engineering. In this paper, we present a multiscale measurement technique based on photometric stereo for accurately reconstructing surface topographies at different scales. Our system employs a zoom lens and LED illuminators, providing the flexibility to adjust the measurement scale. To ensure efficiency and accuracy during scale transition, a fast light source calibration method using a Lambertian sphere is proposed to obtain the position and orientation of the LED precisely and simultaneously. A surface reconstruction algorithm is designed through modeling the light propagation process, enabling the identification of surface features at different levels of detail. The system is calibrated using an Edmund USAF resolution target, which demonstrate the accuracy of our method with the minimum deviation as low as 4μm. The proposed approach is applied to investigate the multiscale surface topography produced by metal additive manufacturing (AM) technique, achieving an accurate representation from contour to roughness. The results are compared with those obtained from a commercial 3D scanner from Keyence, which validate the effectiveness of our method and show its great potential in quality control and optimization of manufacturing processes.

Citation Download Citation

Long Ma, Xu Liu, Yuzhe Liu, Shengwei Guo, and Wenjie Li "Fast calibration based photometric stereo for multiscale metallic surface measurement", Proc. SPIE 12769, Optical Metrology and Inspection for Industrial Applications X, 127690D (27 November 2023); https://doi.org/10.1117/12.2687610

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KEYWORDS

Calibration

Light emitting diodes

Manufacturing

Light sources

Metals

Modeling

Optical spheres

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