Paper
26 September 2023 Automated test methods for standard products (communication protocols) for electric vehicle charging devices
Jing Zhang, Taoyong Li, Yahui Bai
Author Affiliations +
Proceedings Volume 12793, International Conference on Mechatronics and Intelligent Control (ICMIC 2023); 127931Y (2023) https://doi.org/10.1117/12.3007101
Event: International Conference on Mechatronics and Intelligent Control (ICMIC2023), 2023, Wuhan, China
Abstract
In recent years, with the increasing demand for electric vehicles in the Chinese market, there are more and more projects to build electric vehicle charging facilities. In order to ensure that the work of car charging facilities has been maintained relatively reliable and safe, in accordance with the relevant technical specifications, after several years of unremitting efforts of professionals, the compatibility and interoperability methods of components and equipment of research and development of car charging facilities have been formed. This proves that a faster charging device can be put into social use at a high level of reliability and safety. The communication Conformance testing scheme was identified through an analysis of the DC charging communication consistency of the EV charging equipment. The experimental data show that the leakage current limit is set at 30mA and the maximum error is 1.1 Ma. The experimental results show that the controller on the cable can provide protection in case of cable leakage, and the measurement error is less than ± 5mA.
(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Jing Zhang, Taoyong Li, and Yahui Bai "Automated test methods for standard products (communication protocols) for electric vehicle charging devices", Proc. SPIE 12793, International Conference on Mechatronics and Intelligent Control (ICMIC 2023), 127931Y (26 September 2023); https://doi.org/10.1117/12.3007101
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KEYWORDS
Standards development

Safety

Inspection equipment

Data communications

Data modeling

Design and modelling

Reliability

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