Improving AR metrology: cost and risk cuts via optical referencing innovation

Thomas Kerst; Jesper Leppinen; Mikael Jokinen

doi:10.1117/12.2692659

12 March 2024 Improving AR metrology: cost and risk cuts via optical referencing innovation

Thomas Kerst, Jesper Leppinen, Mikael Jokinen

Author Affiliations +

Proceedings Volume 12913, Optical Architectures for Displays and Sensing in Augmented, Virtual, and Mixed Reality (AR, VR, MR) V; 1291311 (2024) https://doi.org/10.1117/12.2692659
Event: SPIE AR | VR | MR, 2024, San Francisco, California, United States

Abstract

Augmented Reality (AR) waveguide metrology requires placing the measurement camera next to the projection optics, thereby complicating system referencing, which requires the camera to be opposite to the projection optics, not next to it. The traditional mechanical solution of rotating and repositioning the camera is expensive and error-prone. This paper introduces an innovative optical technique that eliminates physical adjustments, thus reducing risk, cost and complexity in AR waveguide metrology referencing. We demonstrate that this new optical method provides referencing equal to the classical mechanical approach. This innovative technique has the potential to significantly simplify AR waveguide metrology, providing a cost-effective and risk-reduced method for quality control metrology.

Conference Presentation

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Thomas Kerst, Jesper Leppinen, and Mikael Jokinen "Improving AR metrology: cost and risk cuts via optical referencing innovation", Proc. SPIE 12913, Optical Architectures for Displays and Sensing in Augmented, Virtual, and Mixed Reality (AR, VR, MR) V, 1291311 (12 March 2024); https://doi.org/10.1117/12.2692659

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