Simulation of the influence of electron beam incident parameters on the magnification of electron multiplier tube

Qiang Jiao; Dong Li; Xiaofei Li; Feng Zhou

doi:10.1117/12.3011124

1 November 2023 Simulation of the influence of electron beam incident parameters on the magnification of electron multiplier tube

Qiang Jiao, Dong Li, Xiaofei Li, Feng Zhou

Author Affiliations +

Proceedings Volume 12917, International Conference on Precision Instruments and Optical Engineering (PIOE 2023); 129170Z (2023) https://doi.org/10.1117/12.3011124
Event: 3rd International Conference on Precision Instruments and Optical Engineering (PIOE 2023), 2023, Shanghai, China

Abstract

Electron multiplier tube can be used in the field of electron beam measurement, which can be used to measure the small current electron beam after amplification. In the measurement, in addition to the internal error of the multiplier tube, different incident electron beams will also affect the magnification of the multiplier tube. In order to analyze the error of different incident electron beam parameters on the electron multiplier tube, this paper uses CST to establish the electron multiplier tube model. After verifying the correctness of the simulation model, the energy, incident angle and radius of the incident electron beam are simulated and analyzed. The simulation results show that The parameters of the incident electron beam mainly affect the first multiplication electrode, including its collection efficiency and the number of secondary electrons generated, and ultimately affect the magnification of the electron multiplier tube.

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Qiang Jiao, Dong Li, Xiaofei Li, and Feng Zhou "Simulation of the influence of electron beam incident parameters on the magnification of electron multiplier tube", Proc. SPIE 12917, International Conference on Precision Instruments and Optical Engineering (PIOE 2023), 129170Z (1 November 2023); https://doi.org/10.1117/12.3011124

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