Analysis of the amorphous magnetic ring in the electrical fast transient burst test

He Li; Shujun Tan; Hong Li

doi:10.1117/12.3011795

2 November 2023 Analysis of the amorphous magnetic ring in the electrical fast transient burst test

He Li, Shujun Tan, Hong Li

Proceedings Volume 12919, International Conference on Electronic Materials and Information Engineering (EMIE 2023); 129190C (2023) https://doi.org/10.1117/12.3011795
Event: 3rd International Conference on Electronic Materials and Information Engineering (EMIE 2023), 2023, Guangzhou,, China

Abstract

This article explores the application of amorphous magnetic rings in electrical fast transient burst tests. Amorphous magnetic rings possess unique properties that make them suitable for transient voltage suppression and electromagnetic interference (EMI) filtering. The paper discusses their advantages over other magnetic materials, presents case studies, and highlights their effectiveness in mitigating voltage spikes and reducing EMI. Future research directions are also discussed.

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

He Li, Shujun Tan, and Hong Li "Analysis of the amorphous magnetic ring in the electrical fast transient burst test", Proc. SPIE 12919, International Conference on Electronic Materials and Information Engineering (EMIE 2023), 129190C (2 November 2023); https://doi.org/10.1117/12.3011795

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