Paper
13 December 2023 Large depth range dithered binary focusing fringe projection technique
Ji Tan, Xu Wang, Wenqing Su, Zhaoshui He
Author Affiliations +
Proceedings Volume 12942, First Advanced Imaging and Information Processing Conference (AIIP 2023); 1294203 (2023) https://doi.org/10.1117/12.3005606
Event: 1st Advanced Imaging and Information Processing, 2023, Jinggangshan, China
Abstract
The binary defocusing technique is sensitive to the defocusing degree. The defocusing projection mechanism will introduce high-frequency harmonics at the inappropriate defocused level, leading to limitations in measurement accuracy and depth range. In this paper, a binary-focusing projection technique combining generative adversarial networks is proposed. First, the focusing binary patterns based on error diffusion are projected on the measured surface, and then the captured fringe patterns are input to generative adversarial networks, which achieves sinusoidal correction and optimization for both the focused region and the low-quality defocused region due to its strong image translation ability. Finally, 3D measurement is realized by a phase-shifting algorithm. Compared with the traditional binary defocusing technique, the proposed method is not limited by the defocusing degree and maintains the advantages of high-speed projection, so it can achieve a larger measured depth range and improve measurement accuracy. Simulation and experiments verify the performance of the proposed method.
(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Ji Tan, Xu Wang, Wenqing Su, and Zhaoshui He "Large depth range dithered binary focusing fringe projection technique", Proc. SPIE 12942, First Advanced Imaging and Information Processing Conference (AIIP 2023), 1294203 (13 December 2023); https://doi.org/10.1117/12.3005606
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Binary data

Fringe analysis

Phase unwrapping

3D metrology

RELATED CONTENT


Back to Top