Yield and performance limitations in cooled infrared detector materials

Neil F. Baril; Tony Almeida; Dave Benson; Sumith Bandara; Randy Jacobs; Alex Brown; Andy Stoltz; Peter Smith; Ken Brogden

doi:10.1117/12.3016746

10 June 2024 Yield and performance limitations in cooled infrared detector materials

Neil F. Baril, Tony Almeida, Dave Benson, Sumith Bandara, Randy Jacobs, Alex Brown, Andy Stoltz, Peter Smith, Ken Brogden

Author Affiliations +

Proceedings Volume 13046, Infrared Technology and Applications L; 130460N (2024) https://doi.org/10.1117/12.3016746
Event: SPIE Defense + Commercial Sensing, 2024, National Harbor, Maryland, United States

Abstract

Infrared sensors are an essential technology in the rapid detection and identification of potential threats. Continuous improvements in performance and yield as well as reductions in cost, size, weight, and power consumption are necessary to keep pace with new and emerging threats that are increasing in number and have greater range, speed, and maneuverability. Yield and performance limiting challenges of cooled infrared detector materials and infrared focal plane array processing will be discussed. Paths to addressing some of these challenges including surface passivation, defect identification and analysis, and pixel definition will be presented.

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Citation Download Citation

Neil F. Baril, Tony Almeida, Dave Benson, Sumith Bandara, Randy Jacobs, Alex Brown, Andy Stoltz, Peter Smith, and Ken Brogden "Yield and performance limitations in cooled infrared detector materials", Proc. SPIE 13046, Infrared Technology and Applications L, 130460N (10 June 2024); https://doi.org/10.1117/12.3016746

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