Paper
1 September 1990 Linear arrays of InGaAs/InP avalanche photodiodes for 1.0-1.7 um
Donald A. Ackley, J. Hladky, M. Kazakia, S. M. Mason, G. C. Erickson, Gregory H. Olsen, Vladimir S. Ban, Stephen R. Forrest, Craig O. Staller
Author Affiliations +
Abstract
Separate absorption and multiplication InGaAs/InP avalanche photodiodes (SAM-APDs) with a floating guard ring structure that is well-suited to array applications have been successfully demonstrated. Individual APDs have breakdown voltages greater than 80 V, multiplications over 40 at 100 nA dark current, and uniform spatial gain profiles. Uniform I-V characteristics and gains have been measured over linear dimensions as large as 1.2 cm. Gains over 10 at low multiplied dark currents were measured on 21 consecutive devices at the wafer level.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Donald A. Ackley, J. Hladky, M. Kazakia, S. M. Mason, G. C. Erickson, Gregory H. Olsen, Vladimir S. Ban, Stephen R. Forrest, and Craig O. Staller "Linear arrays of InGaAs/InP avalanche photodiodes for 1.0-1.7 um", Proc. SPIE 1308, Infrared Detectors and Focal Plane Arrays, (1 September 1990); https://doi.org/10.1117/12.21735
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Cited by 1 scholarly publication.
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KEYWORDS
Avalanche photodetectors

Semiconducting wafers

Diffusion

Staring arrays

Infrared detectors

Avalanche photodiodes

Doping

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