Poster
28 August 2024 On how to gain 60nm RMS (for the instrument METIS) in AO control
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Conference Poster
Abstract
For the AO Control of the ELT instrument METIS a two-step method has been developed. First, we reconstruct the incoming wavefront from modulated Pyramid WFS measurements, second, we project this wavefront estimation on a set of modes defined on the M4 of the ELT. Here we focus on the second step, the stable fitting step of a wavefront on modes. We introduce a regularized fitting step on M4 (and subsequently all available modes without truncation) based on the same statistical information as the wavefront reconstructor. In the context of the instrument METIS we gain up to 60nm RMS and a stable performance of the AO system over all seeing and flux conditions studied.
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andreas Obereder, Thomas Bertram, Carlos Correia, Markus Feldt, Stefan Raffetseder, Horst Steuer, and Bernadett Stadler "On how to gain 60nm RMS (for the instrument METIS) in AO control", Proc. SPIE 13097, Adaptive Optics Systems IX, 130977V (28 August 2024); https://doi.org/10.1117/12.3019620
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