XFI: recent applications and detector requirements

Jannis Haak; Florian Ziegler; Theresa Staufer; Florian Grüner

doi:10.1117/12.3027448

4 October 2024 XFI: recent applications and detector requirements

Jannis Haak, Florian Ziegler, Theresa Staufer, Florian Grüner

Proceedings Volume 13151, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXVI; 131510J (2024) https://doi.org/10.1117/12.3027448
Event: Optical Engineering + Applications, 2024, San Diego, California, United States

Abstract

X-ray fluorescence imaging (XFI) is a non-invasive technique enabling key applications such as pharmacokinetic studies and immune cell tracking. Labeling with medium to heavy elements enables detection by excitation with hard X-rays and subsequent measurement of emitted characteristic radiation. XFI provides high spatial resolution, high sensitivity and provides quantitative data. Special requirements need to be fulfilled by the X-ray detectors to reach a high sensitivity. These include high energy resolution, detection efficiency, large active area, and throughput, while minimizing noise from internal detectors effects. Here we discuss recent XFI applications in preclinical imaging and experiences with various detector types.

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Citation Download Citation

Jannis Haak, Florian Ziegler, Theresa Staufer, and Florian Grüner "XFI: recent applications and detector requirements", Proc. SPIE 13151, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXVI, 131510J (4 October 2024); https://doi.org/10.1117/12.3027448

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KEYWORDS

Sensors

Cancer detection

Fluorescence imaging

Signal detection

Signal processing

Spatial resolution

Time metrology

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