Measurement of deep hole verticality by monocular vision

Hui Zhu; Hua Li; Wei Liu; Zhaohui Li; Wenlong Tan

doi:10.1117/12.3030360

3 June 2024 Measurement of deep hole verticality by monocular vision

Hui Zhu, Hua Li, Wei Liu, Zhaohui Li, Wenlong Tan

Author Affiliations +

Proceedings Volume 13182, 2024 International Conference on Optoelectronic Information and Optical Engineering (OIOE 2024); 131820B (2024) https://doi.org/10.1117/12.3030360
Event: 2024 International Conference on Optoelectronic Information and Optical Engineering (OIOE 2024), 2024, Kunming, China

Abstract

To propose a measurement method for the verticality of deep hole based on monocular vision.The coordinate conversion matrix of pentaprism circumferential scanning is derived, and the circumferential scanning trajectory and characteristics of the targets are simulated and analyzed .Based on the visual axis, the normal direction of the measurement datum is constructed to accurately compensate the error between the camera visual axis and the tube datum.For the simulated tube with a radius of 956.21mm, a thickness of 999.55mm and a verticality of 0 mm, the verticality accuracy measured by the system can reach 0.03mm.The actual test shows that the method of measuring the verticality of deep hole with monocular vision is effective and feasible. The system is easy to operate and highly automated, which can greatly improve the measurement efficiency and ensure the measurement accuracy. It is of great significance to the production and measurement of deep holes in nuclear tube sheet.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Hui Zhu, Hua Li, Wei Liu, Zhaohui Li, and Wenlong Tan "Measurement of deep hole verticality by monocular vision", Proc. SPIE 13182, 2024 International Conference on Optoelectronic Information and Optical Engineering (OIOE 2024), 131820B (3 June 2024); https://doi.org/10.1117/12.3030360

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KEYWORDS

Visualization

Matrices

Cameras

Visual optics

Optical surfaces

Reflection

Imaging systems

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