Scanning near-field microscopies

Dieter W. Pohl; James K. Gimzewski

doi:10.1117/12.34815

1 July 1990 Scanning near-field microscopies

Dieter W. Pohl, James K. Gimzewski

Proceedings Volume 1319, Optics in Complex Systems; (1990) https://doi.org/10.1117/12.34815
Event: 15th International Optics in Complex Systems, 1990, Garmisch, Germany

Abstract

Optical images whose resolution is not limited by diffraction can be created by recording the radiation from a point-like (subwavelength size) probe light source while raster scanning it across an object in immediate proximity. An imaging capability with resolution in the range from 1 to 50 nm has been demonstrated with various types of light sources including luminescence from an STM junction in transmission as well as in reflection emission and in a topographic mode. This paper gives a brief overview of the underlying principles followed by a discussion of a few selected results.

Citation Download Citation

Dieter W. Pohl and James K. Gimzewski "Scanning near-field microscopies", Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); https://doi.org/10.1117/12.34815

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