Shearing interferometer for testing wavefront

Stefan M. B. Baumer; Rainer Thieme

doi:10.1117/12.22165

1 July 1990 Shearing interferometer for testing wavefronts

Stefan M. B. Baumer, Rainer Thieme

Proceedings Volume 1319, Optics in Complex Systems; (1990) https://doi.org/10.1117/12.22165
Event: 15th International Optics in Complex Systems, 1990, Garmisch, Germany

Abstract

Interferometric tests are widely used to test high precision optical systems. This kind of testing is about the only way to assure the desired accuracy and performance of those systems. In this paper a new lateral shearing interferometer (LSI) will be presented originally designed to test infinity corrected microscope objectives.

Citation Download Citation

Stefan M. B. Baumer and Rainer Thieme "Shearing interferometer for testing wavefronts", Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); https://doi.org/10.1117/12.22165

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