The method of wavefront analysis is based on the metrological simulation
of optical ray tracing. Many rays, selected by a pinhole, will be
analysed sequentially, so that the transverse ray aberrations measured
with a elekironic coordinate-detector can be stored in the computer. Due
to low power per ray photon counting must be applied. The aberrations are
necessary to start a mathematical analysis by the computer and the result
is the wavefront from the lens under test for one point represented by
the Niiboer-Zernike-coefficients. This method needs no addditional
optics, so it is possible to measure with ligth of any wavelength
especially with ultravioleti ligth, too.
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