Paper
1 December 1990 Observing diamond defects with an analytical color-fluorescence electron microscope
Kazuhito Nishimura, Tohru Nakano, Hirotami Koike, Hiroshi Tomimori, Hiroshi Kawarada, Akio Hiraki, Kazuo Ogawa
Author Affiliations +
Abstract
Vie have developed an analytical color fluorescence electron microscope (ACFEM) which is now being studied as a possible tool for evaluating diamonds. The ACFEM permits observation using colors corresponding to cathodoluminescence (CL) wavelengths in the visible region (400700nm) to distinguish the type size and distribution of emission centers and emission bands of diamonds. The ACFEM is an effective tool for determing the conditions used for synthesizing chemical vapor deposition (CVD) diamonds and is far superior to xpS and SIMS as a tool for analyzing dopants. 1.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kazuhito Nishimura, Tohru Nakano, Hirotami Koike, Hiroshi Tomimori, Hiroshi Kawarada, Akio Hiraki, and Kazuo Ogawa "Observing diamond defects with an analytical color-fluorescence electron microscope", Proc. SPIE 1325, Diamond Optics III, (1 December 1990); https://doi.org/10.1117/12.22472
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Diamond

Chemical vapor deposition

Crystals

Raman spectroscopy

Boron

Electron microscopes

X-ray diffraction

RELATED CONTENT

Creation of superhard C3N4 films by laser ablation
Proceedings of SPIE (May 07 1999)
Field emission from diamond and diamondlike films
Proceedings of SPIE (August 18 1998)
Diamond deposition at low temperature by EACVD
Proceedings of SPIE (October 19 2001)
Optical properties of boron-doped diamond films
Proceedings of SPIE (November 20 1992)

Back to Top