Space/performance qualification of the tape automated bonded devices

Omkarnath K. Gupta; James J. Knight

doi:10.1117/12.23021

1 November 1990 Space/performance qualification of the tape automated bonded devices

Omkarnath K. Gupta, James J. Knight

Proceedings Volume 1339, Materials, Devices, Techniques, and Applications for Z-Plane Focal Plane Array Technology II; (1990) https://doi.org/10.1117/12.23021
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

Quality assurance, wafer lot production, device testing, postprobe processing, and qualification and quality screening of tape automated bonded devices are discussed. These devices are qualifed for space applications and ready to assemble directly into production modules.

Citation Download Citation

Omkarnath K. Gupta and James J. Knight "Space/performance qualification of the tape automated bonded devices", Proc. SPIE 1339, Materials, Devices, Techniques, and Applications for Z-Plane Focal Plane Array Technology II, (1 November 1990); https://doi.org/10.1117/12.23021

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