Time dependency of temperature of a laser-irradiated infrared target pixel as a low-pass filter

Marija Scholl; James W. Scholl

doi:10.1117/12.23116

1 November 1990 Time dependency of temperature of a laser-irradiated infrared target pixel as a low-pass filter

Marija Scholl, James W. Scholl

Proceedings Volume 1341, Infrared Technology XVI; (1990) https://doi.org/10.1117/12.23116
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

The thermal response of a surface layer of a pixel on an infrared target simulator is discussed. This pixel is maintained at a constant temperature by a rapidly scanning laser beam. An analytical model has been developed to describe the exact temperature dependence of a pixel as a function of time for different pixel refresh rates. The top layer of the pixel surface that generates the gray-body radiation shows the temperature dependence on time that is characteristic of a low-pass filter. The experimental results agree with the analytical predictions. The application of a pulsed laser beam to a noncontact, nondestructive diagnostic technique of surface characterization for the presence of microdefects is discussed.

Citation Download Citation

Marija Scholl and James W. Scholl "Time dependency of temperature of a laser-irradiated infrared target pixel as a low-pass filter", Proc. SPIE 1341, Infrared Technology XVI, (1 November 1990); https://doi.org/10.1117/12.23116

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