Paper
1 September 1991 High-spatial-resolution and high-sensitivity interferometric optical-time-domain reflectometer
Masaru Kobayashi, Juichi Noda, Kazumasa Takada, Henry F. Taylor
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Abstract
An interferometric optical-time-domain reflectometer is presented. The system is a low- coherence interferometer using a superluminescent diode and has a spatial resolution of 20 micrometers . A high-sensitivity system is described which performs balanced and narrow band detections and has a detectable limit of -130 dB, which is 10 dB lower than the Rayleigh scattered light power in optical fibers. A polarization-independent system is proposed which adopts polarization-diversity detection to suppress the influence of the polarization fluctuation of the scattered light. A CO2 laser probing method is applied using the thermo- optic effect to identify scattering centers in optical circuits. Measurement of fault locations, reflectivity, and characterization of optical components with the systems are also described.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Masaru Kobayashi, Juichi Noda, Kazumasa Takada, and Henry F. Taylor "High-spatial-resolution and high-sensitivity interferometric optical-time-domain reflectometer", Proc. SPIE 1474, Optical Technology for Signal Processing Systems, (1 September 1991); https://doi.org/10.1117/12.44932
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KEYWORDS
Reflectivity

Mirrors

Light scattering

Waveguides

Laser scattering

Interferometry

Scattering

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