Defect detection on composite materials by phase-step interferometry

Xia Zhao; Yueguang Lu; Gen-shan Jinag

doi:10.1117/12.135348

1 January 1992 Defect detection on composite materials by phase-step interferometry

Xia Zhao, Yueguang Lu, Gen-shan Jinag

Proceedings Volume 1553, Laser Interferometry IV: Computer-Aided Interferometry; (1992) https://doi.org/10.1117/12.135348
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

Phase-step interferometry is a novel method in modern optical technology. In this paper, the basic principles of the technique are briefly described. A holographic phase-step system for the detection on composite materials was presented. The automatic recognition method of the defect by computer was also discussed.

Citation Download Citation

Xia Zhao, Yueguang Lu, and Gen-shan Jinag "Defect detection on composite materials by phase-step interferometry", Proc. SPIE 1553, Laser Interferometry IV: Computer-Aided Interferometry, (1 January 1992); https://doi.org/10.1117/12.135348

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