Paper
1 January 1992 Optimization of the ESPI technique for extended practically oriented deformation measurements
Gerd Guelker, Olaf Haack, Klaus D. Hinsch, Claudia Hoelscher, Juergen Kuls
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Abstract
Substitution of common lasers by small laser diodes gains increasing popularity since it serves for compactness of measurement systems. The possibility of tuning the emitted wavelength simply by changing the injection current is very attractive for systems applying phase shift methods. Usage of optomechanical elements to produce the required phase shifts is superseded. Phase shifting by laser diode tuning was implemented into the presented electronic speckle pattern interferometry (ESPI) setup. Automatic evaluation of fringe systems is done using the Carre phase shift method. Influences of variations of laser power due to changed injection current and decorrelation of speckle patterns due to the altered wavelength are found to be neglectable.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gerd Guelker, Olaf Haack, Klaus D. Hinsch, Claudia Hoelscher, and Juergen Kuls "Optimization of the ESPI technique for extended practically oriented deformation measurements", Proc. SPIE 1553, Laser Interferometry IV: Computer-Aided Interferometry, (1 January 1992); https://doi.org/10.1117/12.135301
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Phase shifts

Semiconductor lasers

Phase shifting

Speckle pattern

Surface roughness

Interferometry

Modulation

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