Moire image overlapping method for PCB inspection designator

Rang-Seng Chang; Yeu-Jent Hu

doi:10.1117/12.50816

1 December 1991 Moire image overlapping method for PCB inspection designator

Rang-Seng Chang, Yeu-Jent Hu

Proceedings Volume 1567, Applications of Digital Image Processing XIV; (1991) https://doi.org/10.1117/12.50816
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

Computer pattern recognition has been expanding its application in various fields. Its application in printed circuit board (PCB) inspection, for example, will accordingly reduce the requirement of manpower as well as the error rate, if equipped with adequate accessories; real time processing can then be implemented with defect locating feature. The design philosophy of this system is focused on how to establish a complete PCB inspection methodology with an error indication for a more effective amending process. The algorithm of this system is as follows: first, use the CCD camera to scan the PCB under inspection, then compare it with the correct one, which has already been stored in the computer memory, and compare the results. If any error exists, then a `+' will be marked on the defect spot from the computer, and overlapping will be executed via a computer-controlled zooming LCD (liquid crystal display) overhead projector. The `+' mark can specify the defect spot clearly. The size and the position of the overlapping image with the tested PCB will be exactly one to one. The optical distortion error is corrected by computer program using the moire and optical analysis method.

Citation Download Citation

Rang-Seng Chang and Yeu-Jent Hu "Moire image overlapping method for PCB inspection designator", Proc. SPIE 1567, Applications of Digital Image Processing XIV, (1 December 1991); https://doi.org/10.1117/12.50816

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KEYWORDS

Inspection

Digital image processing

Moire patterns

LCDs

Projection systems

Error analysis

Image processing

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