Use of focusing by bent perfect Si crystals for short-wavelength neutron monochromatization

Volker Wagner; Pavel Mikula

doi:10.1117/12.130653

23 November 1992 Use of focusing by bent perfect Si crystals for short-wavelength neutron monochromatization

Volker Wagner, Pavel Mikula

Proceedings Volume 1738, Neutron Optical Devices and Applications; (1992) https://doi.org/10.1117/12.130653
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

Reflectivity and resolution properties of cylindrically bent silicon crystals were investigated for their possible employment as short wavelength monochromators. We report flux density measurements of monochromatic neutrons at the sample position of a conventional diffractometer in the wavelength range from 0.05 nm to 0.09 nm for Si(311) and Si(422) reflections. From the obtained data, the optimum crystal thickness and bending radius for a chosen neutron wavelength and the gain in intensity in comparison with a flat mosaic monochromator can be estimated. Further, the use of momentum space focusing in diffraction experiments is discussed.

Citation Download Citation

Volker Wagner and Pavel Mikula "Use of focusing by bent perfect Si crystals for short-wavelength neutron monochromatization", Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); https://doi.org/10.1117/12.130653

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