Paper
29 June 1992 Normal incidence spectrophotometer using high density transmission grating technology and highly efficiency silicon photodiodes for absolute solar EUV irradiance measurements
Howard S. Ogawa, Donald R. McMullin, Darrell L. Judge, Raj S. Korde
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Abstract
New developments in transmission grating and photodiode technology now make it possible to realize spectrometers in the extreme ultraviolet (EUV) spectral region (wavelengths less than 1000 A) which are expected to be virtually constant in their diffraction and detector properties. Time dependent effects associated with reflection gratings are eliminated through the use of free standing transmission gratings. These gratings together with recently developed and highly stable EUV photodiodes have been utilized to construct a highly stable normal incidence spectrophotometer to monitor the variability and absolute intensity of the solar 304 A line. Owing to its low weight and compactness, such a spectrometer will be a valuable tool for providing absolute solar irradiance throughout the EUV. This novel instrument will also be useful for cross-calibrating other EUV flight instruments and will be flown on a series of Hitchhiker Shuttle Flights and on SOHO. A preliminary version of this instrument has been fabricated and characterized, and the results are described.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Howard S. Ogawa, Donald R. McMullin, Darrell L. Judge, and Raj S. Korde "Normal incidence spectrophotometer using high density transmission grating technology and highly efficiency silicon photodiodes for absolute solar EUV irradiance measurements", Proc. SPIE 1745, Instrumentation for Planetary and Terrestrial Atmospheric Remote Sensing, (29 June 1992); https://doi.org/10.1117/12.60605
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KEYWORDS
Spectrometers

Extreme ultraviolet

Photodiodes

Diodes

Diffraction gratings

Quantum efficiency

Calibration

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