Single-event test methodology for integrated optoelectronics

Kenneth A. LaBel; James Alford Cooley; E. G. Stassinopoulos; Paul W. Marshall; Christina M. Crabtree

doi:10.1117/12.141888

6 April 1993 Single-event test methodology for integrated optoelectronics

Kenneth A. LaBel, James Alford Cooley, E. G. Stassinopoulos, Paul W. Marshall, Christina M. Crabtree

Proceedings Volume 1794, Integrated Optical Circuits II; (1993) https://doi.org/10.1117/12.141888
Event: Fibers '92, 1992, Boston, MA, United States

Abstract

As spacecraft require lighter weight and higher speed communication systems, technologies such as fiber optics have come to the forefront. The space radiation environment, however, can be quite harsh in its effects on a fiber optic system. This paper presents the methodology behind testing integrated optoelectronic receivers and transmitters for single event upsets (SEUs). Two main causes of single event effects in the space environment are discussed, namely protons (trapped and solar flare) and galactic cosmic rays, as well as ground test facilities used to simulate the space environment. The prime emphasis presented herein is on the actual test requirements and system schemes needed for devices such as integrated optoelectronics. The definition of an SEU is unique to each fiber optic system application: a setup that is capable of detecting small signal 'glitches' may not be realistic when the interface circuitry utilizes an overlying system protocol or sampling scheme. Additionally, the expected system utilization rates may also affect the SEU rates. Actual test data and applications are discussed.

Citation Download Citation

Kenneth A. LaBel, James Alford Cooley, E. G. Stassinopoulos, Paul W. Marshall, and Christina M. Crabtree "Single-event test methodology for integrated optoelectronics", Proc. SPIE 1794, Integrated Optical Circuits II, (6 April 1993); https://doi.org/10.1117/12.141888

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