Characteristics of anodic sulfide films for passivation of HgCdTe photodiodes

Der-Tsyr Fan; Liang Po Chen; ChengDer Chiang; Ya-Tung Cherng; Yen-Ming Pang; Sheng-Jehn Yang

doi:10.1117/12.131269

26 October 1992 Characteristics of anodic sulfide films for passivation of HgCdTe photodiodes

Der-Tsyr Fan, Liang Po Chen, ChengDer Chiang, Ya-Tung Cherng, Yen-Ming Pang, Sheng-Jehn Yang

Proceedings Volume 1814, Optical Sensors; (1992) https://doi.org/10.1117/12.131269
Event: International Symposium on Optoelectronics in Computers, Communications, and Control, 1992, Hsinchu, Taiwan

Abstract

Anodic sulfides were grown on HgCdTe using different electrolyte concentrations and current densities. These sulfide films were characterized by film thickness, refractive index, and composition depth profile. The results demonstrate a strong dependence of film properties on the extent of electrolyte polarization. By enhancing the polarization effect during anodization high quality sulfide/HgCdTe interfaces, and thus satisfactory electrical characteristics, are obtained.

Citation Download Citation

Der-Tsyr Fan, Liang Po Chen, ChengDer Chiang, Ya-Tung Cherng, Yen-Ming Pang, and Sheng-Jehn Yang "Characteristics of anodic sulfide films for passivation of HgCdTe photodiodes", Proc. SPIE 1814, Optical Sensors, (26 October 1992); https://doi.org/10.1117/12.131269

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