X-ray investigation of defects in SrLaAlO4 single crystals

Krystyna Mazur; Jerzy Sass; Anna Pajaczkowska

doi:10.1117/12.156907

15 October 1993 X-ray investigation of defects in SrLaAlO₄ single crystals

Krystyna Mazur, Jerzy Sass, Anna Pajaczkowska

Proceedings Volume 1845, Liquid and Solid State Crystals: Physics, Technology and Applications; (1993) https://doi.org/10.1117/12.156907
Event: Liquid and Solid State Crystals: Physics, Technology, and Applications, 1992, Zakopane, Poland

Abstract

The SrLaAlO₄ single crystals are used as a substrate for high temperature superconductor epitaxial layers with uniform physical properties. Good quality of epitaxial layers requires both crystallographic perfection and appropriate physical properties of substrate material. In this paper we investigated the crystallographic perfection of SrLaAlO₄ crystals by means of x-ray diffraction topography. The samples were cut-out perpendicular to [100] direction. In some of the samples the present investigations revealed thin lamellar volume defects. It was stated at different interplanar spacing in the defect region.

Citation Download Citation

Krystyna Mazur, Jerzy Sass, and Anna Pajaczkowska "X-ray investigation of defects in SrLaAlO₄ single crystals", Proc. SPIE 1845, Liquid and Solid State Crystals: Physics, Technology and Applications, (15 October 1993); https://doi.org/10.1117/12.156907

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