Scene Matching With Feature Detection

J. F. Belsher; H. F. Williams; R. H. Kin

doi:10.1117/12.957494

4 September 1979 Scene Matching With Feature Detection

J. F. Belsher, H. F. Williams, R. H. Kin

Proceedings Volume 0186, Digital Processing of Aerial Images; (1979) https://doi.org/10.1117/12.957494
Event: 1979 Huntsville Technical Symposium, 1979, Huntsville, United States

Abstract

The Rockwell Pattern Matcher (RPM) is a feature based image matcher which has been demonstrated on passive IR and active laser images. Edge features are extracted and used to match electro-optical images. Matches have been made to reference images at the same wavelength as well as with reference imagery at the optical wavelength. In addition, a technique using three dimensional edge references has been utilized to automatically compensate the effects of geometric distortions due to different perspectives. Recent advances in computing technology make it passible to perform the required digital processing for a variety of applications.

Citation Download Citation

J. F. Belsher, H. F. Williams, and R. H. Kin "Scene Matching With Feature Detection", Proc. SPIE 0186, Digital Processing of Aerial Images, (4 September 1979); https://doi.org/10.1117/12.957494

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