Effect of random rough interfaces in a multilayer stack

R. Garcia Llamas

doi:10.1117/12.2308543

26 July 1993 Effect of random rough interfaces in a multilayer stack

R. Garcia Llamas

Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 19833G (1993) https://doi.org/10.1117/12.2308543
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary

Abstract

The sum of several periodic functions is used as an approach to simulate random interfaces in multilayers where a metal is coated with a dielectric thin-film or viceversa. Experimental deviations from reflectivity of such systems respect to those with smooth interfaces are well explained with the Rayleigh theory.

Citation Download Citation

R. Garcia Llamas "Effect of random rough interfaces in a multilayer stack", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 19833G (26 July 1993); https://doi.org/10.1117/12.2308543

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available