Paper
1 December 1993 Reflection, scattering, and polarization from a very rough black surface
Soe-Mie F. Nee, Jean M. Bennett, Philip C. Archibald
Author Affiliations +
Abstract
In this paper we study the effects of depolarization and scattering from a rough surface over a large range of wavelengths, additional measurements are reported that have been made on a very rough black anodized aluminum sample.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Soe-Mie F. Nee, Jean M. Bennett, and Philip C. Archibald "Reflection, scattering, and polarization from a very rough black surface", Proc. SPIE 1995, Optical Scattering: Applications, Measurement, and Theory II, (1 December 1993); https://doi.org/10.1117/12.162650
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Data modeling

Scattering

Reflectivity

Aluminum

Ellipsometry

Profilometers

Electromagnetic scattering theory

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