Test efficiency: a simple parameter for comparing adhesive fracture tests for adhesion measurement

Yeh-Hung Lai; David A. Dillard

doi:10.1117/12.158602

27 September 1993 Test efficiency: a simple parameter for comparing adhesive fracture tests for adhesion measurement

Yeh-Hung Lai, David A. Dillard

Proceedings Volume 1999, Adhesives Engineering; (1993) https://doi.org/10.1117/12.158602
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

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Yeh-Hung Lai and David A. Dillard "Test efficiency: a simple parameter for comparing adhesive fracture tests for adhesion measurement", Proc. SPIE 1999, Adhesives Engineering, (27 September 1993); https://doi.org/10.1117/12.158602

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