Performance of back-illuminated Tektronix CCDs in the extreme ultraviolet

J. Daniel Moses; Russell A. Howard; Dennis Wang; Richard C. Catura; James R. Lemen; Lawrence Shing; Robert A. Stern; Jean-Francois E. Hochedez; Jean-Pierre Delaboudiniere

doi:10.1117/12.162837

19 November 1993 Performance of back-illuminated Tektronix CCDs in the extreme ultraviolet

J. Daniel Moses, Russell A. Howard, Dennis Wang, Richard C. Catura, James R. Lemen, Lawrence Shing, Robert A. Stern, Jean-Francois E. Hochedez, Jean-Pierre Delaboudiniere

Author Affiliations +

Proceedings Volume 2006, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV; (1993) https://doi.org/10.1117/12.162837
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

The quantum efficiency (QE) and flat field characteristics of back-illuminated 1024 X 1024 Tektronix CCDs have been measured in the extreme ultraviolet (EUV) between 44 and 1216 angstroms. These CCDs have been fabricated for the focal plane detector of the Extreme-ultraviolet Imaging Telescope (EIT) on the Solar and Heliospheric Observing spacecraft. The back-side surface of the EIT CCDs have been specially processed to enhance and stabilize the EUV QE. All requirements for QE are met by these devices, although a poorly understood variation of QE with temperature will complicate data analysis.

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J. Daniel Moses, Russell A. Howard, Dennis Wang, Richard C. Catura, James R. Lemen, Lawrence Shing, Robert A. Stern, Jean-Francois E. Hochedez, and Jean-Pierre Delaboudiniere "Performance of back-illuminated Tektronix CCDs in the extreme ultraviolet", Proc. SPIE 2006, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV, (19 November 1993); https://doi.org/10.1117/12.162837

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