Optical constant determination for x-ray materials

Michele M. Wilson; Jongmin Kim; Muamer Zukic; Douglas G. Torr

doi:10.1117/12.168583

15 February 1994 Optical constant determination for x-ray materials

Michele M. Wilson, Jongmin Kim, Muamer Zukic, Douglas G. Torr

Proceedings Volume 2010, X-Ray and Ultraviolet Polarimetry; (1994) https://doi.org/10.1117/12.168583
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

In the x-ray region of the spectrum, the optical constants of electron beam vacuum evaporated absorbing thin films are determined by measuring the reflectance at a number of angles of incidence. A method for calculating the optical constants through an iteration process of matching calculated and measured values of the reflectance is described.

Citation Download Citation

Michele M. Wilson, Jongmin Kim, Muamer Zukic, and Douglas G. Torr "Optical constant determination for x-ray materials", Proc. SPIE 2010, X-Ray and Ultraviolet Polarimetry, (15 February 1994); https://doi.org/10.1117/12.168583

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