Fourier Transform spectrometry at low resolution: how low can you go?

Peter R. Griffiths

doi:10.1117/12.166563

31 January 1994 Fourier Transform spectrometry at low resolution: how low can you go?

Peter R. Griffiths

Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166563
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada

Abstract

The advantages of measuring infrared spectra at low resolution are discussed from both a theoretical and practical standpoint. Multicomponent analysis of materials with strongly overlapping bands can be achieved at resolutions at least an order of magnitude greater than the full-width at half height of the narrowest bands in the spectrum of any component. Discriminant analysis of vapor-phase spectra can be performed at a resolution of 50 cm^-1 without significant loss of accuracy.

Citation Download Citation

Peter R. Griffiths "Fourier Transform spectrometry at low resolution: how low can you go?", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); https://doi.org/10.1117/12.166563

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