Optimization of position of geometrical frame by SNV

Long-De Chen; Fu-Ling Zhao; Man Li

doi:10.1117/12.156347

22 September 1993 Optimization of position of geometrical frame by SNV

Long-De Chen, Fu-Ling Zhao, Man Li

Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156347
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China

Abstract

The geometrical frame moves in different directions and areas when its tolerance zones and (or) location dimensions are determined in defferent ways. In this paper, by means of the measured coordinate values of the toleranced features, vectors are used to study the translations and (or) rotations of the geometrical frame, and further to judge if the errors are minimum and up to standard when the constraining conditions are satisfied. The diameter of the minimum envelope circle of error is the value of the error being searched. During translation and (or) rotation of the geometrical frame, if there are any the same name vectors (SNV for short) on the envelope circle of error which envelops the measured elements, or, in spite of SNVs , the envelope circle of error cannot be further reduced because of the constraint of the reference, such an envelope circle of error is called the minimum one. The results obtained show that 1 . the minimum envelope circle of position error can be found using SNV technique; 2. on the circle there may be 4, 3, 2 even just 1 point because of the constraint of the reference; 3 . the SNV technique can describe the change of the geometrical frame visually and is convenient for on-the-spot technological analysis; 4. whether the geometrical frame has compensation of reference or not, the position errors can be evaluated; 5. this technique is suitable for judging the measured results of a hole group distributed on a rectangle or a circumference.

Citation Download Citation

Long-De Chen, Fu-Ling Zhao, and Man Li "Optimization of position of geometrical frame by SNV", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); https://doi.org/10.1117/12.156347

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KEYWORDS

Tolerancing

Composites

Visualization

Radon

Visual analytics

Computing systems

Error analysis

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