Paper
30 August 1993 Mm-wave dielectric measurementswith an electric-field cross-correlation Fourier transform spectrometer
Hanyi Ding
Author Affiliations +
Proceedings Volume 2104, 18th International Conference on Infrared and Millimeter Waves; 210412 (1993) https://doi.org/10.1117/12.2298470
Event: 18th International Conference on Infrared and Millimeter Waves, 1993, Colchester, United Kingdom
Abstract
This paper describes a method for measuring dielectric complex permittivitybased on an electric-field cross-correlation Fourier-transform spectrometer.The method is a time-domain one, its principle can be extended over the wholemicrowave region. The parameters of Teflon, plexigrass and a kind of sand weremeasured in 8mm-wave region, the accuracy of three or four significant figuresof e r can be achieved, and the relative accuracy of tans is only about 10%.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hanyi Ding "Mm-wave dielectric measurementswith an electric-field cross-correlation Fourier transform spectrometer", Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 210412 (30 August 1993); https://doi.org/10.1117/12.2298470
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KEYWORDS
Dielectrics

Spectroscopy

Fourier transforms

Microwave radiation

Electronics

Solids

Waveguides

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