Paper
31 October 1994 Optical monitoring of vitreous films: structure and composition
I. P. Lisovskii, Vladimir G. Litovchenko, V. B. Lozinskii, E. G. Schmidt
Author Affiliations +
Proceedings Volume 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1994) https://doi.org/10.1117/12.191970
Event: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: International Workshop, 1993, Kiev, Ukraine
Abstract
A method of structure analysis of vitreous films is proposed, which enables us to obtain the information on the kinds and concentrations of the main structural components of the material, and to create the statistical picture of the most probable arrangement of the atoms in film lattice. The method is based on the computer analysis of the shape of IR-absorption spectrum. The capabilities of the method are demonstrated on the example of structure analysis of amorphous silicon-oxygen phase.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
I. P. Lisovskii, Vladimir G. Litovchenko, V. B. Lozinskii, and E. G. Schmidt "Optical monitoring of vitreous films: structure and composition", Proc. SPIE 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (31 October 1994); https://doi.org/10.1117/12.191970
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KEYWORDS
Vitreous

Deconvolution

Oxygen

Oxides

Silicon

Absorption

Statistical analysis

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