Trilinear, 32-stage, selectable TDI CCD image sensor for high-resolution color scanning applications

M. Suhail Agwani; David A. Dobson; William D. Washkurak; Savvas G. Chamberlain

doi:10.1117/12.172767

1 May 1994 Trilinear, 32-stage, selectable TDI CCD image sensor for high-resolution color scanning applications

M. Suhail Agwani, David A. Dobson, William D. Washkurak, Savvas G. Chamberlain

Proceedings Volume 2172, Charge-Coupled Devices and Solid State Optical Sensors IV; (1994) https://doi.org/10.1117/12.172767
Event: IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology, 1994, San Jose, CA, United States

Abstract

A high-performance time delay and integration (TDI) CCD image sensor has been developed at DALSA for color scanning applications. The imager comprises three individual 2048 X 32 linear arrays, each with its own color filter for spectral separation. The number of stages in each TDI array can be selected separately in blocks of 4, 8, 16, and 32 for optimum sensitivity over a wide range of illumination conditions. The device is fabricated using a dual metal NMOS buried channel CCD process with a 3-phase, 3-poly imaging region for increased charge storage. The pixel height and pitch is 14 micrometers and the center to center separation between the color channels is 560 micrometers . The data is read out using a 2-phase CCD shift register with a 14 micrometers pitch at an output data rate of 15 MHz per output. The die size is 31.4 mm X 4.3 mm and is housed in a 40 pin, 2.0' X 0.61', dual in line package. In this paper the authors discuss the design and the performance evaluation of the device.

Citation Download Citation

M. Suhail Agwani, David A. Dobson, William D. Washkurak, and Savvas G. Chamberlain "Trilinear, 32-stage, selectable TDI CCD image sensor for high-resolution color scanning applications", Proc. SPIE 2172, Charge-Coupled Devices and Solid State Optical Sensors IV, (1 May 1994); https://doi.org/10.1117/12.172767

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