Novel GO-NO GO minimum resolvable temperature difference tester and its development

Roger C. Braddick; J. H. Ludlow

doi:10.1117/12.180067

8 July 1994 Novel GO-NO GO minimum resolvable temperature difference tester and its development

Roger C. Braddick, J. H. Ludlow

Proceedings Volume 2224, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing V; (1994) https://doi.org/10.1117/12.180067
Event: SPIE's International Symposium on Optical Engineering and Photonics in Aerospace Sensing, 1994, Orlando, FL, United States

Abstract

The measurement of minimum resolvable temperature difference (MRTD) of a thermal imaging system has always had problems. It is subjective and it requires laboratory conditions (normally air conditioned for a constant temperature), expensive measuring equipment, and a considerable period of time. The problems to be encountered in carrying out this measurement on, for example, the battlefield would be far worse. This paper describes a novel test instrument for quickly making measurements of MRTD in a GO-NO GO, pass or fail, mode in either the quality department of a company or in the field under difficult weather conditions. This paper will also describe the assessment of a demonstrator system and results obtained under laboratory conditions and under conditions where the demonstrator was thermally stressed to mimic field use. This paper will also briefly describe further minor modifications to the equipment which would allow a full MRTD measurement to be made.

Citation Download Citation

Roger C. Braddick and J. H. Ludlow "Novel GO-NO GO minimum resolvable temperature difference tester and its development", Proc. SPIE 2224, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing V, (8 July 1994); https://doi.org/10.1117/12.180067

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