Paper
15 July 1994 High-performance long-wave infrared HgCdTe scanning focal plane arrays for surveillance applications
Samuel C. H. Wang, Gregg K. Dudoff, Steven R. Jost, John Roussis, Jeffrey Voelker, Michael L. Winn, T. J. Wyman
Author Affiliations +
Abstract
This paper describes an advanced scanning long wavelength IR focal plane array fabricated in HgCdTe. Comprised of an array of front-side illuminated, planar n-on-p homojunction diodes mated to a Si CMOS readout integration circuit, the array has a measured average spectral cutoff wavelength of 10.8 micrometers at 65 K with an average quantum efficiency of 87%. The FPA's peak D* at temperatures of 65 and 78 K, in the absence of background radiation, exceeds 9.3 X 1011 and 2.6 X 1011 cm(root)Hz/W, respectively. No appreciable 1/f noise is evident even for reverse bias voltages as large as 50 mV. Both the spectral and the spatial responses of the diode are well-behaved; and the measured noise contribution due to background radiation agrees with theory.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Samuel C. H. Wang, Gregg K. Dudoff, Steven R. Jost, John Roussis, Jeffrey Voelker, Michael L. Winn, and T. J. Wyman "High-performance long-wave infrared HgCdTe scanning focal plane arrays for surveillance applications", Proc. SPIE 2225, Infrared Detectors and Focal Plane Arrays III, (15 July 1994); https://doi.org/10.1117/12.179710
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Long wavelength infrared

Mercury cadmium telluride

Staring arrays

Infrared radiation

Surveillance

Diodes

Integrated circuit design

RELATED CONTENT


Back to Top