Effect of subgrain boundaries on the producibility of detector arrays fabricated on traveling heater method (THM) materials

Y. Juravel; Avishai Kepten; Abraham Fraenkel; Eliezer Weiss; A. Marcus; N. Amir; Y. Hanin

doi:10.1117/12.179663

13 July 1994 Effect of subgrain boundaries on the producibility of detector arrays fabricated on traveling heater method (THM) materials

Y. Juravel, Avishai Kepten, Abraham Fraenkel, Eliezer Weiss, A. Marcus, N. Amir, Y. Hanin

Author Affiliations +

Proceedings Volume 2228, Producibility of II-VI Materials and Devices; (1994) https://doi.org/10.1117/12.179663
Event: SPIE's International Symposium on Optical Engineering and Photonics in Aerospace Sensing, 1994, Orlando, FL, United States

Abstract

The traveling heater method (THM) is usually characterized by crystal defects such as grain boundaries and dislocations. The need for low cost HgCdTe FPA systems requires high photodiode yield. This demands understanding the crystal defect-diode relationships and necessitates a sorting method that is able to sort the as grown THM wafers before process according to the probability of achieving large photodiode arrays. This paper discusses the influence of crystals defects on photodiode performance and presents a sorting method which is under development. Oriented [111] THM HgCdTe crystals were grown and long wave N⁺P photodiode arrays were fabricated on the A (metal) face. It is found that individual or clusters of high current diodes which deviate drastically from their neighbors -- in current magnitude and in their slope on a Weibull distribution -- could be explained by a correspondence of excessive leakage and low angle sub-grain boundaries which cross the diode location. The distribution of single and multiple defects is compared to models based on isolated point defects and line defects. Yield implications of these results as a function of array design are described.

Citation Download Citation

Y. Juravel, Avishai Kepten, Abraham Fraenkel, Eliezer Weiss, A. Marcus, N. Amir, and Y. Hanin "Effect of subgrain boundaries on the producibility of detector arrays fabricated on traveling heater method (THM) materials", Proc. SPIE 2228, Producibility of II-VI Materials and Devices, (13 July 1994); https://doi.org/10.1117/12.179663

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available