Electronic shearography (ESPSI) for direct measurement of strains

Wolfgang Steinchen; Lian Xiang Yang; M. Schuth; Gerhard Kupfer

doi:10.1117/12.194322

15 November 1994 Electronic shearography (ESPSI) for direct measurement of strains

Wolfgang Steinchen, Lian Xiang Yang, M. Schuth, Gerhard Kupfer

Author Affiliations +

Proceedings Volume 2248, Optical Measurements and Sensors for the Process Industries; (1994) https://doi.org/10.1117/12.194322
Event: Optics for Productivity in Manufacturing, 1994, Frankfurt, Germany

Abstract

Holographic interferometry is an optical method for measuring displacement. However, it is the first or second derivative of displacement in many cases that is of interest, rather than the displacement information. Shearography which has developed in the last twelve years permits full-field, noncontacting measurement of the first derivative of displacement, and, therefore, it is rapidly gaining acceptance by the industry. This paper presents the recent development of shearography in technique and in theory. A few applications are shown in this paper.

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Wolfgang Steinchen, Lian Xiang Yang, M. Schuth, and Gerhard Kupfer "Electronic shearography (ESPSI) for direct measurement of strains", Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); https://doi.org/10.1117/12.194322

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