Measurement of surface topography by remote sensing

Terry D. Kunz; Don Di Rosa; John M. Hill; Fran Stetina; Donald S. Friedman

doi:10.1117/12.188818

4 October 1994 Measurement of surface topography by remote sensing

Terry D. Kunz, Don Di Rosa, John M. Hill, Fran Stetina, Donald S. Friedman

Proceedings Volume 2270, NASA/SPIE Conference on Spin-Off Technologies from NASA for Commercial Sensors and Scientific Applications; (1994) https://doi.org/10.1117/12.188818
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

The Houston Advanced Research Center and the National Aeronautics and Space Administration, Goddard Space Flight Center, Technology Utilization Office have recently miniaturized an Airborne LIDAR Topographic Mapping System (ALTMS) and begun to economically collect accurate data from a commercial, photogrammetry based aircraft. This ALTMS incorporates off-the-shelf state-of-the-art laser and new computerized data acquisition technology to record and process digital topographic data. A color video camera collects tandem imagery. This paper describes the first products that have been generated from ALTMS data. Numerous government agency and industry pilot projects are being scheduled and the ALTMS is soon to be offered as a commercial system and service in the very near future.

Citation Download Citation

Terry D. Kunz, Don Di Rosa, John M. Hill, Fran Stetina, and Donald S. Friedman "Measurement of surface topography by remote sensing", Proc. SPIE 2270, NASA/SPIE Conference on Spin-Off Technologies from NASA for Commercial Sensors and Scientific Applications, (4 October 1994); https://doi.org/10.1117/12.188818

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